VM-OCT+

Vibration monitoring on very sensitive equipment, e.g. electron microscopes and photolithography equipment, in microelectronics and nanotechnology

Evaluation of vibrations according to VC and nano criteria

Sound pressure level analysis with acoustic weightings

Long-term monitoring with alarm function

Two cursors for displaying frequency and amplitude with snap function

Up to four signals in one window

By means of the clone function, up to four VM-OCT+ with different settings can measure simultaneously

External signaling devices can be controlled

Offline measurement possible